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Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.

Abstract:

The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure-property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of the device. These defects are closely related to strain distributions. The present work compares electron and X-ray diffraction as well as Raman spectroscopy, which provide access to microstrain dist...

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Publication status:
Published
Peer review status:
Peer reviewed

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
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Name:
Helmholtz Virtual Institute Microstructure Control in Thin-Film Solar Cells
Grant:
VI-520
Publisher:
Elsevier
Journal:
Ultramicroscopy More from this journal
Volume:
169
Pages:
89-97
Publication date:
2016-07-01
Acceptance date:
2016-07-02
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
Pmid:
27459269
Language:
English
Keywords:
Pubs id:
pubs:634491
UUID:
uuid:a92db8af-1f26-42be-a76c-d7006bc3d89a
Local pid:
pubs:634491
Source identifiers:
634491
Deposit date:
2016-09-09

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