Journal article
Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
- Abstract:
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The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure-property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of the device. These defects are closely related to strain distributions. The present work compares electron and X-ray diffraction as well as Raman spectroscopy, which provide access to microstrain dist...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Access Document
- Files:
-
-
(Accepted manuscript, pdf, 2.6MB)
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- Publisher copy:
- 10.1016/j.ultramic.2016.07.001
Authors
Funding
Bibliographic Details
- Publisher:
- Elsevier Publisher's website
- Journal:
- Ultramicroscopy Journal website
- Volume:
- 169
- Pages:
- 89-97
- Publication date:
- 2016-07-01
- Acceptance date:
- 2016-07-02
- DOI:
- EISSN:
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1879-2723
- ISSN:
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0304-3991
- Pmid:
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27459269
Item Description
- Language:
- English
- Keywords:
- Pubs id:
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pubs:634491
- UUID:
-
uuid:a92db8af-1f26-42be-a76c-d7006bc3d89a
- Local pid:
- pubs:634491
- Source identifiers:
-
634491
- Deposit date:
- 2016-09-09
Terms of use
- Copyright holder:
- Elsevier BV
- Copyright date:
- 2016
- Notes:
- © 2016 Elsevier B.V. All rights reserved.
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