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A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis.

Abstract:
The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with an in situ micromanipulator is an ideal tool to systematically prepare such demanding samples. The methodology is described and discussed in detail, and several results are presented to demonstrate the potential of the technique.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Micron (Oxford, England : 1993) More from this journal
Volume:
39
Issue:
3
Pages:
320-328
Publication date:
2008-01-01
DOI:
EISSN:
1878-4291
ISSN:
0968-4328
Language:
English
Keywords:
Pubs id:
pubs:172955
UUID:
uuid:a911c67b-d9e3-4b1d-8f80-2db96115386b
Local pid:
pubs:172955
Source identifiers:
172955
Deposit date:
2012-12-19

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