Conference item
Finding phase information in the darkness
- Abstract:
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High resolution local structure information is revealed when the complex exit wavefunction is restored from a series of transmission electron microscope (TEM) images. Aberration corrected image data sets allow high spatial frequency information to be restored but this is often at the expense of lower spatial frequencies. In this paper we present a new approach to exit wavefunction restoration using a novel five image focal series with non-uniform focal steps. This data set extends the spatial...
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- Publication status:
- Published
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- Publisher copy:
- 10.1088/1742-6596/241/1/012013
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Bibliographic Details
- Volume:
- 241
- Pages:
- 012013-012013
- Host title:
- ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009)
- Publication date:
- 2010-01-01
- DOI:
- EISSN:
-
1742-6596
- ISSN:
-
1742-6588
- Source identifiers:
-
124572
Item Description
- Pubs id:
-
pubs:124572
- UUID:
-
uuid:a8579600-6c3c-4e6e-ad4d-adedf6c5ed2c
- Local pid:
- pubs:124572
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 2010
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