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Conference item

Finding phase information in the darkness

Abstract:

High resolution local structure information is revealed when the complex exit wavefunction is restored from a series of transmission electron microscope (TEM) images. Aberration corrected image data sets allow high spatial frequency information to be restored but this is often at the expense of lower spatial frequencies. In this paper we present a new approach to exit wavefunction restoration using a novel five image focal series with non-uniform focal steps. This data set extends the spatial...

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Publication status:
Published

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Volume:
241
Pages:
012013-012013
Host title:
ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009)
Publication date:
2010-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
Source identifiers:
124572
Pubs id:
pubs:124572
UUID:
uuid:a8579600-6c3c-4e6e-ad4d-adedf6c5ed2c
Local pid:
pubs:124572
Deposit date:
2012-12-19

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