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Thesis

Applications of focal-series data in scanning-transmission electron microscopy

Abstract:

Since its development, the scanning transmission electron microscope has rapidly found uses right across the material sciences. Its use of a finely focussed electron probe rastered across samples offers the microscopist a variety of imaging and spectroscopy signals in parallel. These signals are individually intuitive to interpret, and collectively immensely powerful as a research tool. Unsurprisingly then, much attention is concentrated on the optical quality of the electron probes used. ...

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Oxford college:
St Catherine's College
Role:
Author

Contributors

Division:
MPLS
Department:
Materials
Role:
Supervisor
Division:
MPLS
Department:
Materials
Role:
Supervisor
Publication date:
2013
Type of award:
DPhil
Level of award:
Doctoral
Awarding institution:
University of Oxford
Language:
English
Keywords:
Subjects:
UUID:
uuid:a6f2a4d5-e77a-47a5-b2d7-aab4b7069ce2
Local pid:
ora:11848
Deposit date:
2015-07-10

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