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Test set generation and fault localization software for reversible circuits

Abstract:
We discuss some properties of reversible circuits that allow them to be tested more efficiently than their classical counterparts, and give an analysis of currently proposed fault models. We also present an efficient algorithm that can be used to generate fault localization trees for large circuits.

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Journal:
Proc. 7th International Symposium on Representations and Methodologies for Emergent Computing Technologies‚ Tokyo‚ Japan More from this journal
Pages:
8
Publication date:
2005-09-01
UUID:
uuid:a691ec56-dd8a-4016-93f6-9e581b384d58
Local pid:
cs:4050
Deposit date:
2015-03-31

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