Journal article
Test set generation and fault localization software for reversible circuits
- Abstract:
- We discuss some properties of reversible circuits that allow them to be tested more efficiently than their classical counterparts, and give an analysis of currently proposed fault models. We also present an efficient algorithm that can be used to generate fault localization trees for large circuits.
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Bibliographic Details
- Journal:
- Proc. 7th International Symposium on Representations and Methodologies for Emergent Computing Technologies‚ Tokyo‚ Japan
- Pages:
- 8
- Publication date:
- 2005-09-01
Item Description
- UUID:
-
uuid:a691ec56-dd8a-4016-93f6-9e581b384d58
- Local pid:
- cs:4050
- Deposit date:
- 2015-03-31
Terms of use
- Copyright date:
- 2005
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