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High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.

Abstract:

In this paper we explore methods of measuring elastic strain variations in the presence of larger lattice rotations (up to -11°) using high resolution electron backscatter diffraction. We have examined the fundamental equations which relate pattern shifts to the elastic strain tensor and modified them to a finite deformation framework from the original infinitesimal deformation one. We incorporate the traction free boundary condition into the minimisation problem for the finite deformation ca...

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Publication status:
Published

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Authors


Britton, TB More by this author
Wilkinson, AJ More by this author
Journal:
Ultramicroscopy
Volume:
114
Pages:
82-95
Publication date:
2012-03-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:a6268b16-ab61-4230-9e39-d0225e501251
Source identifiers:
313067
Local pid:
pubs:313067

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