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Investigation of single surface acoustic wave sources

Abstract:
The first experimental investigation of a single gap surface acoustic wave (SAW) source on GaAs is reported. Using scanning acoustic force microscopy, SAWs are measured with sub-wavelength resolution and an unmatched sensitivity. Phase and amplitude images reveal the radiation characteristics of a single gap source, allowing for a deeper insight into SAW device operation and future design improvements.
Publication status:
Published

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Publisher copy:
10.1049/el:20001311

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Condensed Matter Physics
Role:
Author
Publisher:
IEE
Journal:
ELECTRONICS LETTERS
Volume:
36
Issue:
22
Pages:
1903-1904
Publication date:
2000-10-26
DOI:
ISSN:
0013-5194
Language:
English
Pubs id:
pubs:151507
UUID:
uuid:a099f1b9-a1c2-4a61-863c-5c7a17002687
Local pid:
pubs:151507
Source identifiers:
151507
Deposit date:
2012-12-19

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