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SURFACE SEGREGATION OF SR IN DOPED MGO - COMPARISON BETWEEN X-RAY PHOTOELECTRON-SPECTROSCOPY AND ATOMISTIC IONIC MODEL SIMULATIONS

Abstract:

The surface coverage of Sr on doped MgO ceramics has been measured by angle-resolved X-ray photoelectron spectroscopy (XPS) for bulk doping levels in the range 3-1000 ppm. The experimental data are compared with results derived from atomistic simulations of the doped surface. At low doping levels Sr segregates by substitutional replacement of Mg in the top-most ionic layer of the ceramic and good agreement is found between the experimental Sr 3d:Mg 2s intensity ratio and values derived from a...

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Publication status:
Published

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Publisher copy:
10.1039/jm9910100785

Authors


Journal:
JOURNAL OF MATERIALS CHEMISTRY
Volume:
1
Issue:
5
Pages:
785-788
Publication date:
1991-09-01
DOI:
EISSN:
1364-5501
ISSN:
0959-9428
Source identifiers:
43655
Language:
English
Keywords:
Pubs id:
pubs:43655
UUID:
uuid:a065e3f9-375f-4ded-afaf-63f585c09d4e
Local pid:
pubs:43655
Deposit date:
2012-12-19

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