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Accurate evaluation of aberration for probe-forming system and influence of aberration on high-resolution STEM image

Abstract:
The influence of residual three-fold astigmatism on high-resolution STEM imaging of graphene has been investigated. The aberration was measured by the segmented Ronchigram auto-correlation function method using the graphene lattice. In the presence of residual threefold astigmatism the graphene lattice showed a lower three-fold rotational symmetry where three C atoms in the six membered ring had a higher intensity.
Publication status:
Published
Peer review status:
Peer reviewed

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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Oxford college:
Linacre College
Role:
Author
Publisher:
Insitute of Physics
Host title:
Electron Microscopy and Analysis Group Conference 2017 (EMAG2017)
Journal:
Electron Microscopy and Analysis Group Conference 2017 (EMAG2017) More from this journal
Publication date:
2017-10-01
Acceptance date:
2017-10-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
Pubs id:
pubs:809850
UUID:
uuid:a06306c1-187e-4a93-874e-5947d228f59f
Local pid:
pubs:809850
Source identifiers:
809850
Deposit date:
2018-02-27

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