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Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment

Abstract:

We analyse the link between precision of pattern shift measurements and the resolution of the measurement of elastic strain and lattice rotation using high resolution electron backscatter diffraction (HR-EBSD). This study combines analysis of high quality experimentally obtained diffraction patterns from single crystal silicon; high quality dynamical simulations using Bloch wave theory; quantitative measurements of the detector Modulation Transfer Function (MTF) and a numerical model. We have...

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Authors


Britton, TB More by this author
Tarleton, E More by this author
Kirkland, AI More by this author
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Journal:
Ultramicroscopy
Volume:
135
Pages:
126-135
Publication date:
2013-12-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:a057eaae-8f90-41df-a4a2-b7e7a9b2e34f
Source identifiers:
440626
Local pid:
pubs:440626
Language:
English
Keywords:

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