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An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field

Abstract:

In the scanning transmission electron microscope, an accurate knowledge of detector collection angles is paramount in order to quantify signals on an absolute scale. Here we present an optical configuration designed for the accurate measurement of collection angles for both image-detectors and energy-loss spectrometers. By deflecting a parallel electron beam, carefully calibrated using a diffraction pattern from a known material, we can directly observe the projection-distortion in the post-s...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted manuscript

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Publisher copy:
10.1111/jmi.12672

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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
Corpus Christi College
Role:
Author
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Funding agency for:
Jones, L
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Funding agency for:
Jones, L
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Funding agency for:
Varambhia, A
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Funding agency for:
Varambhia, A
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Publisher:
Wiley Publisher's website
Journal:
Journal of Microscopy Journal website
Volume:
270
Issue:
2
Pages:
176-187
Publication date:
2018-01-08
Acceptance date:
2017-11-28
DOI:
EISSN:
1365-2818
ISSN:
0022-2720
Pubs id:
pubs:817243
URN:
uri:9ba793d1-66d4-4c73-a07b-cab44a6da5f3
UUID:
uuid:9ba793d1-66d4-4c73-a07b-cab44a6da5f3
Local pid:
pubs:817243

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