Journal article icon

Journal article

Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source

Abstract:

Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern synchrotrons and free-electron lasers as a wavefront-sensing technique for optics alignment, monitoring and correction. Recent developments in the ptychography reconstruction process now incorporate a ...

Expand abstract
Publication status:
Published
Peer review status:
Peer reviewed

Actions


Access Document


Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Expand authors...
Publisher:
International Union of Crystallography Publisher's website
Journal:
Journal of Synchrotron Radiation Journal website
Volume:
27
Issue:
2020
Pages:
1688-1695
Publication date:
2020-10-16
Acceptance date:
2020-09-02
DOI:
EISSN:
1600-5775
ISSN:
0909-0495
Pmid:
33147195
Pubs id:
1141047
Local pid:
pubs:1141047
Language:
English
Keywords:
Format:
Print-Electronic

Terms of use


Metrics


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP