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Combining Laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution

Abstract:

The X-ray Laue microdiffraction technique, available at beamline BM32 on the synchrotron ESRF, is ideally suited for probing the field of elastic strain (and associated stress) in deformed polycrystalline materials with a micrometric spatial resolution. We show that using Digital Image Correlation for measuring Laue pattern distortions between two mechanical states improves significantly the estimate of elastic strain increment. The potentiality of this new Laue-DIC method is illustrated on a...

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Institution:
University of Oxford
Department:
Oxford, MPLS, Engineering Science
Role:
Author
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Journal:
Procedia IUTAM
Volume:
4
Pages:
133-143
Publication date:
2012-01-01
DOI:
EISSN:
2210-9838
ISSN:
2210-9838
URN:
uuid:9ad22dbb-8468-4833-90f2-8a56807e91ba
Source identifiers:
380049
Local pid:
pubs:380049

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