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Some aspects of image projection in the field-ion microscope

Abstract:

The projection of ions in the field-ion microscope image of a tungsten specimen has been measured for a number of different conditions. It is well known that the relationship L = k theta holds, where theta is the angle from the tip axis. However, we have found that for a typical field-of-view the L = k theta relationship also holds to a fair degree of accuracy for all angles in the image. The effect of off-axis projection is found to match a simple geometrical model, in which the ion trajecto...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Warren, PJ More by this author
Smith, GDW More by this author
Volume:
79
Issue:
1-4
Pages:
251-257
Publication date:
1999-09-05
DOI:
ISSN:
0304-3991
URN:
uuid:9a838443-2a25-436a-ae08-60d997cb895f
Source identifiers:
27412
Local pid:
pubs:27412

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