Conference item
Comprehensive characterization of a FEGTEM
- Abstract:
- Several improvements have been made in the methodology of determining imaging aberrations - especially three-fold astigmatism coma and spherical aberration - from measurements of image shifts and diffractogram shapes, to characterise a microscope recently installed in Oxford. The combined use of shift and diffractogram measurements has been develop to address tilt calibration problems, and a new approach based on simpler measurements devised.
- Publication status:
- Published
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Bibliographic Details
- Journal:
- ELECTRON MICROSCOPY AND ANALYSIS 1999
- Issue:
- 161
- Pages:
- 259-262
- Publication date:
- 1999-01-01
- Event title:
- Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute of Physics (EMAG 99)
- ISSN:
-
0951-3248
- Source identifiers:
-
7756
- ISBN:
- 0750305770
Item Description
- Keywords:
- Pubs id:
-
pubs:7756
- UUID:
-
uuid:962a800d-1d16-4837-9ff0-feee872a2204
- Local pid:
- pubs:7756
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 1999
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