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Self-similar Sketch

Abstract:

We introduce the self-similar sketch, a new method for the extraction of intermediate image features that combines three principles: detection of self-similarity structures, nonaccidental alignment, and instance-specific modelling. The method searches for self-similar image structures that form nonaccidental patterns, for example collinear arrangements. We demonstrate a simple implementation of this idea where self-similar structures are found by looking for SIFT descriptors that map to the s...

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Publication status:
Published

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Publisher copy:
10.1007/978-3-642-33709-3_7

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Engineering Science
Zisserman, A More by this author
Journal:
COMPUTER VISION - ECCV 2012, PT II
Volume:
7573
Issue:
PART 2
Pages:
87-100
Publication date:
2012
DOI:
EISSN:
1611-3349
ISSN:
0302-9743
URN:
uuid:9522d692-3f4f-4392-88c6-fdd8e165c344
Source identifiers:
360061
Local pid:
pubs:360061

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