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Anomalous elastic response of silicon to uniaxial shock compression on nanosecond time scales.

Abstract:

We have used x-ray diffraction with subnanosecond temporal resolution to measure the lattice parameters of orthogonal planes in shock compressed single crystals of silicon (Si) and copper (Cu). Despite uniaxial compression along the (400) direction of Si reducing the lattice spacing by nearly 11%, no observable changes occur in planes with normals orthogonal to the shock propagation direction. In contrast, shocked Cu shows prompt hydrostaticlike compression. These results are consistent with ...

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Publication status:
Published

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Publisher copy:
10.1103/physrevlett.86.2349

Authors


Loveridge-Smith, A More by this author
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Journal:
Physical review letters
Volume:
86
Issue:
11
Pages:
2349-2352
Publication date:
2001-03-05
DOI:
EISSN:
1079-7114
ISSN:
0031-9007
URN:
uuid:9515cf37-2920-4d11-9bfd-c1afc36a810e
Source identifiers:
26962
Local pid:
pubs:26962
Language:
English

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