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Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy

Abstract:

A reduction in the focal depth of field as a result of the installation of aberration correctors in scanning transmission electron microscopy, allows three-dimensional information to be retrieved by optical depth sectioning. A three-dimensional representation of the specimen is achieved by recording a series of images over a range of focal values. Optical depth sectioning in zone-axis crystals is explored computationally using a Bloch wave analysis to explain the form of the electron intensit...

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Publication status:
Published

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Volume:
126
Pages:
012036-012036
Publication date:
2008-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
URN:
uuid:93c9c0b2-7f0e-4a12-b831-9659d4e3574c
Source identifiers:
6066
Local pid:
pubs:6066

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