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High resolution surface studies of superplastic deformation

Abstract:

Previous studies of superplasticity using surface markers have tended to use either diamond paste scratches, with which it is difficult to make quantitative measurements, or regular grids with spacing greater than the grain size, which prevents measurements of any deformation occurring within the grains. This paper reports the etching of regular marker grids with submicron line spacings using Focused Ion Beams (FIB), as well as mesoscopic grids with line spacings many grains across. These hav...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Superplasticity in Advanced Materials
Volume:
551-552
Pages:
615-620
Publication date:
2007-01-01
Event title:
9th International Conference on Superplasticity in Advanced Materials
ISSN:
0255-5476
Source identifiers:
27579
ISBN:
9780878494354
Keywords:
Pubs id:
pubs:27579
UUID:
uuid:92251204-f8cd-474f-9e35-3084504e5986
Local pid:
pubs:27579
Deposit date:
2012-12-19

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