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High resolution surface studies of superplastic deformation

Abstract:

Previous studies of superplasticity using surface markers have tended to use either diamond paste scratches, with which it is difficult to make quantitative measurements, or regular grids with spacing greater than the grain size, which prevents measurements of any deformation occurring within the grains. This paper reports the etching of regular marker grids with submicron line spacings using Focused Ion Beams (FIB), as well as mesoscopic grids with line spacings many grains across. These hav...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Volume:
551-552
Pages:
615-620
Publication date:
2007-01-01
ISSN:
0255-5476
URN:
uuid:92251204-f8cd-474f-9e35-3084504e5986
Source identifiers:
27579
Local pid:
pubs:27579
ISBN:
978-0-87849-435-4

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