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PRECIPITATION OF IRON IN SILICON - GETTERING TO EXTENDED SURFACE DEFECT SITES

Abstract:

The gettering of Fe to extended surface defect sites, namely surface pits and oxidation induced stacking faults, has been studied. It is found that, for the conditions investigated, gettering of Fe proceeds by generation of an impurity/crystal defect complex, rather than nucleation of FeSi2 precipitates. The crystal defects are found to be b=1/6〈411〉 interstitial dislocation loops normally observed in the presence of Si1 supersaturation. In this case they are associated with the formation of ...

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Publication status:
Published

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Authors


DECOTEAU, M More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
FALSTER, R More by this author
Volume:
19
Pages:
27-32
Publication date:
1991
URN:
uuid:9200ab4d-953b-4be5-8a3a-81b352312e8f
Source identifiers:
30556
Local pid:
pubs:30556
ISBN:
0-87849-568-1

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