Journal article
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
- Abstract:
-
For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated in plastically deformed body-centred cubic and face-centred cubic ductile metals (ferrite and austenite grains in duplex stainless steel) and brittle single-crystal silicon, which showed that the effect is not only limited to measurement magnitude but al...
Expand abstract
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Version of record, pdf, 9.5MB, Terms of use)
-
- Publisher copy:
- 10.1016/j.ultramic.2023.113705
Authors
Bibliographic Details
- Publisher:
- Elsevier
- Journal:
- Ultramicroscopy More from this journal
- Volume:
- 248
- Article number:
- 113705
- Publication date:
- 2023-02-20
- Acceptance date:
- 2023-02-17
- DOI:
- EISSN:
-
1879-2723
- ISSN:
-
0304-3991
- Pmid:
-
36871367
Item Description
- Language:
-
English
- Keywords:
- Pubs id:
-
1332571
- Local pid:
-
pubs:1332571
- Deposit date:
-
2023-05-22
Terms of use
- Copyright holder:
- Koko et al.
- Copyright date:
- 2023
- Rights statement:
- © 2023 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
- Licence:
- CC Attribution (CC BY)
Metrics
If you are the owner of this record, you can report an update to it here: Report update to this record