Journal article
Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment
- Abstract:
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Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error and precision with this approach was carried out using dynamically simulated target EBSPs with known PC positions and orientations. Results showed that the error in determining the PC and orientation was <10−5 of pattern width and <0.01° respectively...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
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(Preview, Accepted manuscript, pdf, 2.7MB, Terms of use)
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- Publisher copy:
- 10.1016/j.ultramic.2019.04.006
Authors
Bibliographic Details
- Publisher:
- Elsevier
- Journal:
- Ultramicroscopy More from this journal
- Volume:
- 202
- Issue:
- 2019
- Pages:
- 87-99
- Publication date:
- 2019-04-15
- Acceptance date:
- 2019-04-10
- DOI:
- EISSN:
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1879-2723
- ISSN:
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0304-3991
Item Description
- Language:
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English
- Keywords:
- Pubs id:
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pubs:987934
- UUID:
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uuid:909aec25-cf68-418e-9bae-65409f9358fc
- Local pid:
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pubs:987934
- Source identifiers:
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987934
- Deposit date:
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2019-04-15
Terms of use
- Copyright holder:
- Elsevier
- Copyright date:
- 2019
- Rights statement:
- © 2019 Elsevier B.V. All rights reserved.
- Notes:
- This is the accepted manuscript version of the article. The final version is available from Elsevier at: https://doi.org/10.1016/j.ultramic.2019.04.006
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