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Journal article

A new approach for 3D quantitative STEM using defocus corrected electron ptychography

Publication status:
Published
Peer review status:
Peer reviewed

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Files:
Publisher copy:
10.1017/s1431927622002252

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
ORCID:
0000-0002-2443-7819
Publisher:
Oxford University Press
Journal:
Microscopy and Microanalysis More from this journal
Volume:
28
Issue:
S1
Pages:
380-381
Publication date:
2022-08-01
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Language:
English
Keywords:
Pubs id:
1301790
Local pid:
pubs:1301790
Deposit date:
2023-03-23

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