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Sources of variability in long-term testing of silicon tip field emission

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APA Style

Aplin, K., Kent, B., Lockwood, H., Rouse, J., Stevens, R., & Wang, L. (2005). Sources of variability in long-term testing of silicon tip field emission. Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, 2005, 141–142.

MLA Style

Aplin, K., et al. “Sources of Variability in Long-Term Testing of Silicon Tip Field Emission.” Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, vol. 2005, 2005, pp. 141–42.

Chicago Style

Aplin, K, B Kent, H Lockwood, J Rouse, R Stevens, and L Wang. 2005. “Sources of Variability in Long-Term Testing of Silicon Tip Field Emission.” In Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, 2005:141–42.
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Publisher copy:: 10.1109/IVNC.2005.1619525

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+ Aplin, K More by this author

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+ Kent, B More by this author

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+ Lockwood, H More by this author

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+ Rouse, J More by this author

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+ Stevens, R More by this author

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Host title:: Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005
Volume:: 2005
Pages:: 141-142
Publication date:: 2005-01-01
DOI:: 10.1109/IVNC.2005.1619525
ISBN-10:: 0780383974
ISBN-13:: 9780780383975

Pubs id:: pubs:151413
UUID:: uuid:8db875f9-ed6c-4a67-8e1f-990357d5b174
Local pid:: pubs:151413
Source identifiers:: 151413
Deposit date:: 2012-12-19

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Copyright date:: 2005

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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