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X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. II. The combined case

Abstract:

By simultaneous acquisition of the transmitted and the diffracted beams, the applicability of the previously introduced diffraction contrast tomography technique [Ludwig, Schmidt, Lauridsen and Poulsen (2008). J. Appl. Cryst. 41, 302-309] can be extended to the case of undeformed polycrystalline samples containing more than 100 grains per cross section. The grains are still imaged using the occasionally occurring diffraction contribution to the X-ray attenuation coefficient, which can be obse...

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Publication status:
Published

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Publisher copy:
10.1107/S0021889808001726

Authors


Johnson, G More by this author
Honnicke, MG More by this author
Journal:
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume:
41
Issue:
2
Pages:
310-318
Publication date:
2008-04-05
DOI:
EISSN:
1600-5767
ISSN:
0021-8898
URN:
uuid:8c840057-994a-431a-a288-8aa64318e22e
Source identifiers:
177468
Local pid:
pubs:177468

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