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High resolution x-ray characterization of Tl-2212 superconducting thin films

Abstract:

Thallium based high temperature superconducting films were formed on LaAlO3 (LAO) substrates by thalliation of sputtered amorphous precursor films by reaction with Tl2O. High resolution strain measurements and diffraction topographic imaging studies were performed using the synchrotron at Stanford Synchrotron Radiation Laboratory (SSRL). From these results, we have reached preliminary conclusions regarding the effect of film strain and substrate twinning on the superconducting properties of T...

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Journal:
Materials Research Society Symposium - Proceedings
Volume:
678
Publication date:
2001-01-01
ISSN:
0272-9172
Source identifiers:
410834
Language:
English
Pubs id:
pubs:410834
UUID:
uuid:8a4c1df7-11bf-4f0f-8964-9315f70ca981
Local pid:
pubs:410834
Deposit date:
2013-11-17

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