Journal article
High resolution x-ray characterization of Tl-2212 superconducting thin films
- Abstract:
-
Thallium based high temperature superconducting films were formed on LaAlO3 (LAO) substrates by thalliation of sputtered amorphous precursor films by reaction with Tl2O. High resolution strain measurements and diffraction topographic imaging studies were performed using the synchrotron at Stanford Synchrotron Radiation Laboratory (SSRL). From these results, we have reached preliminary conclusions regarding the effect of film strain and substrate twinning on the superconducting properties of T...
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Bibliographic Details
- Journal:
- Materials Research Society Symposium - Proceedings
- Volume:
- 678
- Publication date:
- 2001-01-01
- ISSN:
-
0272-9172
- Source identifiers:
-
410834
Item Description
- Language:
- English
- Pubs id:
-
pubs:410834
- UUID:
-
uuid:8a4c1df7-11bf-4f0f-8964-9315f70ca981
- Local pid:
- pubs:410834
- Deposit date:
- 2013-11-17
Terms of use
- Copyright date:
- 2001
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