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Electron diffraction based techniques in scanning electron microscopy of bulk materials

Abstract:

The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling constrast imaging (ECCI), and electron backscatter diffraction (EBSD) are reviewed. The dynamical diffraction theory is used to describe the physics of electron channelling, and hence the constrast observed in ECPs (and EBSD) and ECCI images of dislocations. Models for calculating channelling contrast are described and their limitat...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1016/S0968-4328(97)00032-2

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Publisher:
Elsevier Publisher's website
Journal:
Micron Journal website
Volume:
28
Issue:
4
Pages:
279-308
Publication date:
1998-01-05
DOI:
EISSN:
1878-4291
ISSN:
0968-4328
Source identifiers:
6886
Language:
English
Keywords:
Pubs id:
pubs:6886
UUID:
uuid:8961d63e-d849-4dfc-a32a-da21e0559659
Local pid:
pubs:6886
Deposit date:
2019-04-11

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