Journal article icon

Journal article

Determining the composition of small features in atom probe: bcc Cu-rich precipitates in an Fe-rich matrix

Abstract:

Aberrations in the ion trajectories near the specimen surface are an important factor in the spatial resolution of the atom probe technique. Near the boundary between two phases with dissimilar evaporation fields, ion trajectory overlaps may occur, leading to a biased measurement of composition in the vicinity of this interface. In the case of very small second-phase precipitates, the region affected by trajectory overlaps may extend to the centre of the precipitate prohibiting a direct measu...

Expand abstract
Publication status:
Published
Peer review status:
Peer reviewed

Actions


Access Document


Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Rolls-Royce plc More from this funder
Publisher:
Elsevier Publisher's website
Journal:
Ultramicroscopy Journal website
Volume:
109
Issue:
5
Pages:
535-540
Publication date:
2009-04-01
DOI:
ISSN:
0304-3991
Language:
English
Keywords:
Subjects:
UUID:
uuid:881bc4cf-e508-4bef-930b-da809dcc78c1
Local pid:
ora:3362
Deposit date:
2010-02-16

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP