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PIXE and RES as a tool for the analysis of historic copper halfpennies

Abstract:

RES and PIXE microbeam analysis is used to investigate the trace element concentrations as well as the surface corrosion of counterfeited copper halfpennies from the mid 18th century. PIXE elemental mapping was used to identify regions with a minimum of light element contamination which could be used for accurate trace element determinations. RES analysis of selected points on the map could be used to confirm the absence of corrosion or contamination, and in addition yielded valuable informat...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
NUCLEAR INSTRUMENTS and METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume:
150
Issue:
1-4
Pages:
651-655
Publication date:
1999-04-01
Event title:
8th International Conference on PIXE and its Analytical Applications
DOI:
ISSN:
0168-583X
Source identifiers:
13826
Pubs id:
pubs:13826
UUID:
uuid:858c8778-432e-4805-bc55-62070d0a84d1
Local pid:
pubs:13826
Deposit date:
2012-12-19

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