Conference item
PIXE and RES as a tool for the analysis of historic copper halfpennies
- Abstract:
-
RES and PIXE microbeam analysis is used to investigate the trace element concentrations as well as the surface corrosion of counterfeited copper halfpennies from the mid 18th century. PIXE elemental mapping was used to identify regions with a minimum of light element contamination which could be used for accurate trace element determinations. RES analysis of selected points on the map could be used to confirm the absence of corrosion or contamination, and in addition yielded valuable informat...
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- Publication status:
- Published
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- Publisher copy:
- 10.1016/S0168-583X(98)00920-3
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Bibliographic Details
- Journal:
- NUCLEAR INSTRUMENTS and METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
- Volume:
- 150
- Issue:
- 1-4
- Pages:
- 651-655
- Publication date:
- 1999-04-01
- Event title:
- 8th International Conference on PIXE and its Analytical Applications
- DOI:
- ISSN:
-
0168-583X
- Source identifiers:
-
13826
Item Description
- Pubs id:
-
pubs:13826
- UUID:
-
uuid:858c8778-432e-4805-bc55-62070d0a84d1
- Local pid:
- pubs:13826
- Deposit date:
- 2012-12-19
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- Copyright date:
- 1999
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