Conference icon

Conference

PIXE and RES as a tool for the analysis of historic copper halfpennies

Abstract:

RES and PIXE microbeam analysis is used to investigate the trace element concentrations as well as the surface corrosion of counterfeited copper halfpennies from the mid 18th century. PIXE elemental mapping was used to identify regions with a minimum of light element contamination which could be used for accurate trace element determinations. RES analysis of selected points on the map could be used to confirm the absence of corrosion or contamination, and in addition yielded valuable informat...

Expand abstract
Publication status:
Published

Actions


Access Document


Authors


Abraham, MH More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Volume:
150
Issue:
1-4
Pages:
651-655
Publication date:
1999-04-05
DOI:
ISSN:
0168-583X
URN:
uuid:858c8778-432e-4805-bc55-62070d0a84d1
Source identifiers:
13826
Local pid:
pubs:13826

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP