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Microstructure and x-ray microtomographic characterisation of deformation in electrodeposited nickel thin-walled hollow spheres

Abstract:

Nanocrystalline grain sizes in the walls of electrodeposited nickel thin-walled hollow spheres were quantified in FIB-TEM and found to fit a log-normal distribution. Based on the microstructure and nanoindentation properties, reliable material data were determined and related to predict bulk compressive behaviour of the spheres through a finite element model. X-ray microtomography of specimens under compression validates the model, and reveals the 3D deformation/failure mechanisms that domina...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Journal:
MATERIALS LETTERS
Volume:
100
Pages:
233-236
Publication date:
2013-06-01
DOI:
ISSN:
0167-577X
Source identifiers:
403204
Language:
English
Keywords:
Pubs id:
pubs:403204
UUID:
uuid:845e013f-d138-495e-b47c-f05ac458d743
Local pid:
pubs:403204
Deposit date:
2013-11-17

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