Journal article icon

Journal article

Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid

Abstract:
A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution of precipitates and solute clusters observed in the alloy are not observed to differ between standard electropolishing methods and Xe plasma preparation. Enabled by site specific specimen preparation, analysis of an α-Al(Fe,Mn)Si dispersoid shows segregation at the phase boundary and in the shell of the dispersoid.
Publication status:
Published
Peer review status:
Peer reviewed

Actions


Access Document


Files:
Publisher copy:
10.1016/j.matchar.2021.111194

Authors


More by this author
Institution:
University of Oxford
Department:
Materials
Sub department:
Physics - Central
Oxford college:
Corpus Christi College
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
ORCID:
0000-0002-7232-8561
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
ORCID:
0000-0002-9256-0966
Publisher:
Elsevier
Journal:
Materials Characterization More from this journal
Volume:
178
Article number:
111194
Publication date:
2021-05-19
Acceptance date:
2021-05-16
DOI:
ISSN:
1044-5803
Language:
English
Keywords:
Pubs id:
1177437
Local pid:
pubs:1177437
Deposit date:
2021-05-21

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP