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Journal article

Thickness dependence of the total magnetic moment per atom in the Cu/Ni/Cu/Si(001) system

Abstract:

Systematic measurements of the magnetic moment per Ni atom in Cu/Ni/Cu/Si(001) structures have been made using polarized neutron reflection (PNR) for Ni thicknesses in the range 30Å

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Publication status:
Published

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Publisher copy:
10.1103/PhysRevB.55.11422

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Journal:
PHYSICAL REVIEW B
Volume:
55
Issue:
17
Pages:
11422-11431
Publication date:
1997-05-01
DOI:
EISSN:
1095-3795
ISSN:
0163-1829
URN:
uuid:800bff8d-c00c-48f7-b701-71ac54cff84e
Source identifiers:
121786
Local pid:
pubs:121786

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