Journal article icon

Journal article

A guide on FIB preparation of samples containing stress corrosion crack tips for TEM and atom-probe analysis

Abstract:

The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with an in situ micromanipulator is an ideal tool to systematically prepare such demanding samples. The methodology is described and discussed in detail, and several results are presented to demonstrate...

Expand abstract

Actions


Access Document


Authors


Lozano-Perez, S More by this author
Journal:
Micron
Volume:
39
Issue:
3
Pages:
320-328
Publication date:
2008-04-05
DOI:
ISSN:
0968-4328
URN:
uuid:7b9ccd92-32fa-42b3-a603-a555cf1ef8a0
Source identifiers:
178566
Local pid:
pubs:178566

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP