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Imaging of interlayer coupling in van der Waals heterostructures using a bright-field optical microscope

Abstract:

Vertically stacked atomic layers from different layered crystals can be held together by van der Waals forces, which can be used for building novel heterostructures, offering a platform for developing a new generation of atomically thin, transparent and flexible devices. The performance of these devices is critically dependent on the layer thickness and the interlayer electronic coupling, influencing the hybridisation of the electronic states as well as charge and energy transfer between the ...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted Manuscript

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Publisher copy:
10.1021/acs.nanolett.7b01763

Authors


Alexeev, EM More by this author
Catanzaro, A More by this author
Skrypka, O More by this author
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Publisher:
American Chemical Society Publisher's website
Journal:
Nano Letters Journal website
Volume:
17
Issue:
9
Pages:
5342–5349
Publication date:
2017-07-28
Acceptance date:
2017-07-28
DOI:
EISSN:
1530-6992
ISSN:
1530-6984
Pubs id:
pubs:710052
URN:
uri:7969cc62-289e-4b41-8c84-8d2c9919945f
UUID:
uuid:7969cc62-289e-4b41-8c84-8d2c9919945f
Local pid:
pubs:710052
Paper number:
9

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