Journal article icon

Journal article

Gate voltage effects in capacitively coupled quantum dots

Abstract:

We study a system of two symmetrical capacitively coupled quantum dots, each coupled to its own metallic lead, focusing on its evolution as a function of the gate voltage applied to each dot. Using the numerical renormalization group and poor man's scaling techniques, the low-energy Kondo scale of the model is shown to vary significantly with the gate voltage, being exponentially small when spin and pseudospin degrees of freedom dominate; but increasing to much larger values when the gate vol...

Expand abstract
Publication status:
Published

Actions


Access Document


Publisher copy:
10.1209/epl/i2006-10219-1

Authors


Mitchell, AK More by this author
Galpin, MR More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Chemistry, Physical and Theoretical Chem
Journal:
Europhys. Lett.
Volume:
76
Issue:
1
Pages:
95
Publication date:
2006-11-08
DOI:
EISSN:
1286-4854
ISSN:
0295-5075
URN:
uuid:7853d206-e324-4bae-8f61-2c4c2f828fe9
Source identifiers:
40073
Local pid:
pubs:40073
Language:
English
Keywords:

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP