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Journal article

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.

Abstract:

The physical basis for using a probe-position integrated cross section (PICS) for a single column of atoms as an effective way to compare simulation and experiment in high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) is described, and the use of PICS in order to make quantitative use of image intensities is evaluated. It is based upon the calibration of the detector and the measurement of scattered intensities. Due to the predominantly incoherent nature of...

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Publication status:
Published

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Journal:
Ultramicroscopy
Volume:
133
Pages:
109-119
Publication date:
2013-10-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:77f57873-a0fe-4da9-bb84-8830a5d14309
Source identifiers:
420816
Local pid:
pubs:420816

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