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DF-Fit : A robust algorithm for detection of crystallographic information in Atom Probe Tomography data

Abstract:

We report on a new algorithm for the detection of crystallographic information in three-dimensional, as retained in atom probe tomography (APT), with improved robustness and signal detection performance. The algorithm is underpinned by one-dimensional distribution functions (DFs), as per existing algorithms, but eliminates an unnecessary parameter as compared to current methods. By examining traditional DFs in an automated fashion in real space, rather than using Fourier transform approaches...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted Manuscript

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Publisher copy:
10.1017/S1431927618015507

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
New College
Role:
Author
ORCID:
0000-0001-9308-2620
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
Publisher:
Cambridge University Press Publisher's website
Journal:
Microscopy and Microanalysis Journal website
Volume:
25
Issue:
2
Pages:
331-337
Publication date:
2019-01-31
Acceptance date:
2018-11-02
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Pubs id:
pubs:945285
URN:
uri:732852e7-0b79-452e-a29d-e9563ec9acb5
UUID:
uuid:732852e7-0b79-452e-a29d-e9563ec9acb5
Local pid:
pubs:945285

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