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Direct wavefront sensing in adaptive optical microscopy using backscattered light.

Abstract:

Adaptive optics has been used to compensate the detrimental effects of aberrations in a range of high-resolution microscopes. We investigate how backscattered laser illumination can be used as the source for direct wavefront sensing using a pinhole-filtered Shack-Hartmann wavefront sensor. It is found that the sensor produces linear response to input aberrations for a given specimen. The gradient of this response is dependent upon experimental configuration and specimen structure. Cross sensi...

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Publication status:
Published

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Publisher copy:
10.1364/ao.52.005523

Authors


Rahman, SA More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Engineering Science
Journal:
Applied optics
Volume:
52
Issue:
22
Pages:
5523-5532
Publication date:
2013-08-05
DOI:
EISSN:
1539-4522
ISSN:
0003-6935
URN:
uuid:730cd4f9-93af-4db4-8b35-7ba5e3921e6f
Source identifiers:
420189
Local pid:
pubs:420189

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