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Journal article

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution.

Abstract:

Recent development in fast pixelated detector technology has allowed a two dimensional diffraction pattern to be recorded at every probe position of a two dimensional raster scan in a scanning transmission electron microscope (STEM), forming an information-rich four dimensional (4D) dataset. Electron ptychography has been shown to enable efficient coherent phase imaging of weakly scattering objects from a 4D dataset recorded using a focused electron probe, which is optimised for simultaneous ...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1016/j.ultramic.2017.02.006

Authors


MacLaren, I More by this author
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Department:
St Antonys College
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Department:
Oxford, MPLS, Materials
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Publisher:
Elsevier Publisher's website
Journal:
Ultramicroscopy Journal website
Volume:
180
Pages:
173-179
Publication date:
2017-04-05
Acceptance date:
2017-02-18
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
Pubs id:
pubs:691123
URN:
uri:72f7254c-6e12-4fea-8ef0-91371148bcb3
UUID:
uuid:72f7254c-6e12-4fea-8ef0-91371148bcb3
Local pid:
pubs:691123

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