Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction

Kirkland, AI; Meyer, RR

Abstract:

Improvements in instrumentation and image handling techniques mean the indirect reconstruction is now realising the promise it has long offered. This approach recovers the phase and modulus of the specimen exit plane wavefunction using datasets comprising either through focal or tiltazimuth series of images. In order to achieve this it is necessary to measure the objective lens aberrations to high accuracy. This paper will review progress in implementing this approach and will present recent reconstructions from a range of materials.

Publication status:

Published

Actions

Email

Email this record

Send the bibliographic details of this record to your email address.

Your Email
Please enter the email address that the record information will be sent to.

Your message (optional)
Please add any additional information to be included within the email.
Cite

Cite this record

APA Style

Kirkland, A. I., & Meyer, R. R. (2004). Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction. 179, 331–336.

MLA Style

Kirkland, A. I., and R. R. Meyer. Indirect Transmission Electron Microscopy; Aberration Measurement and Compensation and Exit Wave Reconstruction. no. 179, 2004, pp. 331–36.

Chicago Style

Kirkland, AI, and RR Meyer. 2004. “Indirect Transmission Electron Microscopy; Aberration Measurement and Compensation and Exit Wave Reconstruction.” In , 331–36.
Tweet
Print

Authors

Kirkland, AI More by this author

Meyer, RR More by this author

Bibliographic Details

Issue:: 179
Pages:: 331-336
Publication date:: 2004
ISSN:: 0951-3248
URN:: uuid:71110518-1a9f-410b-a71a-abdbd18ae6f3
Source identifiers:: 29735
Local pid:: pubs:29735
ISBN:: 0-7503-0967-9

Item Description

Keywords:: FOCUS-VARIATION

RESOLUTION

TEM

Terms of use

License:: Terms and Conditions of Use for Oxford University Research Archive

Views & Downloads

Metrics

If you are the owner of this record, you can report an update to it here: Report update to this record