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Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction

Abstract:
Improvements in instrumentation and image handling techniques mean the indirect reconstruction is now realising the promise it has long offered. This approach recovers the phase and modulus of the specimen exit plane wavefunction using datasets comprising either through focal or tiltazimuth series of images. In order to achieve this it is necessary to measure the objective lens aberrations to high accuracy. This paper will review progress in implementing this approach and will present recent reconstructions from a range of materials.
Publication status:
Published

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Authors


Kirkland, AI More by this author
Issue:
179
Pages:
331-336
Publication date:
2004
ISSN:
0951-3248
URN:
uuid:71110518-1a9f-410b-a71a-abdbd18ae6f3
Source identifiers:
29735
Local pid:
pubs:29735
ISBN:
0-7503-0967-9

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