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Level set methods for modelling field evaporation in atom probe.

Abstract:

Atom probe is a nanoscale technique for creating three-dimensional spatially and chemically resolved point datasets, primarily of metallic or semiconductor materials. While atom probe can achieve local high-level resolution, the spatial coherence of the technique is highly dependent upon the evaporative physics in the material and can often result in large geometric distortions in experimental results. The distortions originate from uncertainties in the projection function between the field e...

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Publication status:
Published

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Publisher copy:
10.1017/s1431927613013299

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume:
19
Issue:
6
Pages:
1709-1717
Publication date:
2013-12-05
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:702ae49b-86d3-4ca9-aefc-8af6f92bedc2
Source identifiers:
420637
Local pid:
pubs:420637

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