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Electron ptychographic microscopy for three-dimensional imaging

Abstract:

Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a co...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1038/s41467-017-00150-1

Authors


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Role:
Author
ORCID:
0000-0003-0788-6687
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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
Corpus Christi College
Role:
Author
ORCID:
0000-0002-5883-6463
More from this funder
Funding agency for:
Martinez, G
Nellist, P
Kirkland, A
Grant:
EP/M010708/1,EP/K032518/1,
EP/K040375/1
TechnologythroughEuropeanElectronMicroscopy
ESTEEM2(EnablingScience
TechnologythroughEuropeanElectronMicroscopy
ESTEEM2(EnablingScience
More from this funder
Funding agency for:
Kirkland, A
Nellist, P
Grant:
TechnologythroughEuropeanElectronMicroscopy
ESTEEM2(EnablingScience
TechnologythroughEuropeanElectronMicroscopy
ESTEEM2(EnablingScience
Publisher:
Springer Nature Publisher's website
Journal:
Nature Communications Journal website
Volume:
8
Issue:
1
Pages:
163
Publication date:
2017-07-31
Acceptance date:
2017-06-06
DOI:
ISSN:
2041-1723
Pmid:
28761117
Language:
English
Pubs id:
pubs:710912
UUID:
uuid:6f7c0c24-84e8-493c-bf79-8d3ba21fc1e1
Local pid:
pubs:710912
Source identifiers:
710912
Deposit date:
2017-12-04

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