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Conference item

ELECTRON-MICROSCOPY OF PROCESS-INDUCED CRYSTAL DEFECTS

Publication status:
Published

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Journal:
STRUCTURE AND PROPERTIES OF DISLOCATIONS IN SEMICONDUCTORS 1989 More from this journal
Volume:
104
Pages:
131-140
Publication date:
1989-01-01
Event title:
6TH INTERNATIONAL SYMP ON THE STRUCTURE AND PROPERTIES OF DISLOCATIONS IN SEMICONDUCTORS
ISBN:
0854980601
Keywords:
Pubs id:
pubs:20070
UUID:
uuid:6ebe551c-d6bd-4ea3-842c-ced8d8e9478e
Local pid:
pubs:20070
Source identifiers:
20070
Deposit date:
2012-12-19

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