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A NEUTRON REFLECTOMETRY STUDY OF THE PRODUCTION OF THIN POLYPHENYLENE FILMS FROM PRECURSOR POLYMER

Abstract:
Neutron reflectometry has been used to study the formation of thin polyphenylene films produced by the aromatization of poly(5,6-cis-diacetocyclohexa-1,3-diene). It has been found that the process results in the production of films with non-uniform density in a direction normal to the surface. In addition, the aromatized films are found to have a much higher surface roughness than the precursor polymer film. This has been attributed to the disrupting effect of the volatile products of aromatization. © 1992.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Physical & Theoretical Chem
Role:
Author
Journal:
POLYMER More from this journal
Volume:
33
Issue:
19
Pages:
4141-4144
Publication date:
1992-01-01
DOI:
ISSN:
0032-3861
Keywords:
Pubs id:
pubs:121690
UUID:
uuid:6e287218-b7ca-492c-9439-423836be71d4
Local pid:
pubs:121690
Source identifiers:
121690
Deposit date:
2012-12-19

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