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Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells

Abstract:

The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, film textures, and grain-boundary types. By evaluation of the EBSD patterns within individual grains of the polycrystalline solar cell layers, microstrain distributions also can be obtained. These m...

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Publication status:
Published

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Publisher copy:
10.1007/s11837-013-0685-1

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Journal:
JOM
Volume:
65
Issue:
9
Pages:
1222-1228
Publication date:
2013-09-05
DOI:
EISSN:
1543-1851
ISSN:
1047-4838
URN:
uuid:6db8cdec-23fb-4abb-a46d-c2ca5fe8c9ee
Source identifiers:
415439
Local pid:
pubs:415439

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