Journal article
Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells
- Abstract:
-
The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, film textures, and grain-boundary types. By evaluation of the EBSD patterns within individual grains of the polycrystalline solar cell layers, microstrain distributions also can be obtained. These m...
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- Publication status:
- Published
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- Publisher copy:
- 10.1007/s11837-013-0685-1
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Authors
Bibliographic Details
- Journal:
- JOM
- Volume:
- 65
- Issue:
- 9
- Pages:
- 1222-1228
- Publication date:
- 2013-09-01
- DOI:
- EISSN:
-
1543-1851
- ISSN:
-
1047-4838
- Source identifiers:
-
415439
Item Description
- Pubs id:
-
pubs:415439
- UUID:
-
uuid:6db8cdec-23fb-4abb-a46d-c2ca5fe8c9ee
- Local pid:
- pubs:415439
- Deposit date:
- 2013-11-17
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- Copyright date:
- 2013
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