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Journal article

Roughness analysis of GaN surfaces at different annealing temperatures for an AlN buffer layer

Publication status:
Published

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Journal:
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume:
51
Issue:
1
Pages:
209-213
Publication date:
2007-07-01
ISSN:
0374-4884
Source identifiers:
17315
Keywords:
Pubs id:
pubs:17315
UUID:
uuid:6c88927e-549c-422e-82c3-d1ed745ba368
Local pid:
pubs:17315
Deposit date:
2012-12-19

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