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Journal article

High-contrast observations with slicer-based integral field spectrographs 1: Simulations

Abstract:

As part of the Phase A study for the EPICS instrument, we investigate if there are any contrast limitations imposed by the choice of the integral field spectrograph (IFS) technology, and if so, to determine the contrast limits applicable to each technology. In this document we investigate (through simulations) the contrast limitations inherent in a slicer based IFS. Current results show the achievable contrast with the slicer to be promising when taking into consideration the fact that the ce...

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Publisher copy:
10.1117/12.857383

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
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Journal:
Proceedings of SPIE - The International Society for Optical Engineering
Volume:
7735
Issue:
PART 1
Publication date:
2010-01-01
DOI:
ISSN:
0277-786X
Source identifiers:
161714
Language:
English
Keywords:
Pubs id:
pubs:161714
UUID:
uuid:6bb073b6-0eb3-4e0d-9b99-e08e86af5cbb
Local pid:
pubs:161714
Deposit date:
2012-12-20

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