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TEM studies of misfit dislocations in strained-layer heterostructures

Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B More from this journal
Pages:
605-606
Publication date:
1994-01-01
Event title:
13th International Congress on Electron Microscopy
ISBN:
2868832261
Pubs id:
pubs:9112
UUID:
uuid:6b303004-4aa1-4e35-9cf7-3f61c6c4b49d
Local pid:
pubs:9112
Source identifiers:
9112
Deposit date:
2012-12-19

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