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Journal article

FIM AND ATOM-PROBE STUDIES OF DEFECTS IN DOPED TUNGSTEN LAMP WIRES

Publication status:
Published

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Journal:
ULTRAMICROSCOPY
Volume:
4
Issue:
3
Pages:
385-386
Publication date:
1979-01-01
DOI:
ISSN:
0304-3991
URN:
uuid:6acfa5be-d441-4179-af2d-59062c8c4602
Source identifiers:
22354
Local pid:
pubs:22354

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