Subsurface damage analysis by TEM and 3D FIB crack mapping in alumina and alumina/5vol.%SiC nanocomposites

Journal article

TEM and 3D crack analysis by focused ion beam (FIB) cross sectioning have been used to quantify the subsurface damage beneath scratches made by a 120° cone indenter loaded to 1 N in monolithic polycrystalline alumina and alumina/5vol.%SiC nanocomposites. In the nanocomposite, an extensive plastic deformation zone was found under the scratch grooves, extending beyond the first layer of grains to a maximum plastic deformation depth of ∼7 μm below the surface of the track. In the alumina, howeve...

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Authors: Wu, H; Roberts, S; Mobus, G; Inkson, B

• Publication status: Published
• Journal: ACTA MATERIALIA
• Volume: 51
• Issue: 1
• Pages: 149-163
• Publication date: 2003-01-08
• DOI: 10.1016/S1359-6454(02)00387-7
• ISSN: 1359-6454
• Language: English
• Keywords: dislocations; focused ion beam (FIB); subsurface damage; nanocomposite; alumina; transmission electron microscope (TEM); microcracks